Case Study: Amazon Web Services (AWS) achieves lifecycle-wide high-speed scan testing and reduced test time with Synopsys SLM HSAT IP

Leveraging Existing High Speed Functional Serial Interfaces for Testing & Monitoring

Synopsys partnered with Amazon Web Services to address testing limits on modern SoCs, where growing design size and performance demand higher scan bandwidth while pin counts and GPIO speeds remain constrained. AWS needed a way to maintain low DPPM and continuous lifecycle testing (wafer sort, final test, system-level and in‑system test) without adding large numbers of slow test pins that bottlenecked scan throughput.

Synopsys SLM High‑Speed Access & Test (HSAT) IP repurposes existing high‑speed functional interfaces such as PCIe and USB to carry scan and TAP data using native protocols, removing GPIO bandwidth limits and reusing established drivers and hardware. The approach scaled with PCIe/USB generations, reduced test time and cost, enabled in‑system diagnostics and root‑cause analysis, and allowed AWS to run comprehensive, lifecycle-long testing and monitoring with higher parallelism and improved fault coverage.

AWS

Amit Pandey

Principal Engineer ASIC