Case Study: Winbond Electronics achieves faster, web-based yield analysis and fewer defects with Rogue Wave Software (JWAVE/PV-WAVE)

Visual Numerics Provides Web-based Interactive Yield > Analysis System for the Semiconductor Industry

Winbond, a leading Taiwanese integrated-circuit manufacturer, faced the challenge of speeding up processing of large volumes of metrology and defect data, building a Web-based engineering data analysis interface, and improving yield analysis to reduce defective products. To meet these needs they turned to Rogue Wave Software, using JWAVE with the PV-WAVE 4GL for interactive, web-enabled visual data analysis.

Rogue Wave Software implemented JWAVE (PV‑WAVE) and provided consulting to create a multi-tier, Java-based interactive yield analysis system that supports intuitive graphics, drill-down analysis and faster development cycles. The new system sped processing of large datasets, improved yield-analysis efficiency, reduced the number of defective products and boosted overall production efficiency, with the new solution developed in collaboration over a six-month engagement.

Winbond

Yang Ching Sheng

Deputy Manager Parameter Engineering