Case Study: Captronic Systems Pvt Ltd reduces SSR radar test time with National Instruments PXI and LabVIEW

Using PXI Modular Instruments and LabVIEW for Secondary Surveillance Radar ATE

Captronic Systems Pvt Ltd needed to test their secondary surveillance radars with a more efficient and cost-effective solution than manual desktop instrument connections. They faced the challenge of rigorously testing all radar functionality and physical parameters before deployment in military and civil aviation. They turned to National Instruments for a solution.

National Instruments provided a solution built on NI PXI modular instruments and the LabVIEW software environment. This created a customized, automated test system that simulated targets, analyzed signals, and performed comprehensive functional tests. This solution allowed Captronic Systems' customer to reduce radar test time by 90 percent and achieve 60 percent cost savings compared to other test systems built with traditional instruments.

Captronic Systems Pvt Ltd

Vishwanath Kalkur

Captronic Systems Pvt Ltd