National Instruments
124 Case Studies
A National Instruments Case Study
Texas Instruments faced the challenge of improving the speed and reducing the complexity of their RF test benches, which were comprised of multiple traditional rack-and-stack instruments. The increased functionality of their combo RFICs made characterization difficult, and they needed to reduce test time and cost without sacrificing measurement accuracy for their FM transmitter testing.
National Instruments provided a solution using their NI PXI platform, including a vector signal analyzer and LabVIEW software. This cost-effective solution reduced test time by almost six times, cutting a full-channel sweep from seven hours to 76 minutes. The platform also reduced system costs by nearly half and significantly decreased calibration downtime, allowing Texas Instruments to shorten time to market and improve measurement quality.
Min Xu
Texas Instruments, Inc.