Case Study: ST-Ericsson achieves 10X faster semiconductor test time with National Instruments PXI and LabVIEW

ST-Ericsson Reduces Semiconductor Test Time by 10X With LabVIEW and NI PXI RF Tools

National Instruments (vendor) worked with ST-Ericsson, a leader in semiconductor development for mobile devices, to overcome the challenge of upgrading a characterization lab. The customer needed a highly flexible validation test solution capable of meeting a wide variety of RF standards and performing stringent tests on complex chips.

The solution implemented by National Instruments involved replacing bulky, traditional instruments with a software-defined NI PXI platform, including FlexRIO and a PXI vector signal analyzer. This approach resulted in a test system that was three times less expensive and ten times faster, reducing the time for 800,000 measurements from three days to just eight hours.

ST-Ericsson

Sylvain Bertrand

ST-Ericsson