Case Study: G Systems, LP reduces wafer probe test time by 50% with National Instruments PXI-based automation

PXI-Based Automated Wafer Probe Tester

G Systems, Inc. was facing the challenge of increasing wafer probe test throughput and improving tester flexibility for its semiconductor sensor production. Their outdated, expensive equipment was not expandable, which complicated their goal of increasing capacity.

National Instruments provided a solution using NI LabVIEW software and NI Switch Executive to develop an automated, PXI-based test system. This new configurable system, built around NI hardware, reduced total test time by more than 50 percent, resulting in significant cost savings for the customer.

G Systems, Inc.

Andrew Kahn

G Systems, Inc.