Case Study: ON Semiconductor Belgium speeds up image sensor test times with NI Semiconductor Test System

ON Semiconductor Speeds Up Test Times With the Semiconductor Test System

ON Semiconductor Belgium, a worldwide supplier of silicon solutions, needed to develop a high-end, scalable, and cost-effective automated test equipment (ATE) solution for its new generation of high-performance image sensors. The challenge involved handling intense data rates and providing the necessary stimuli and compute power, which existing testers on the market could not meet without significant and costly modification.

National Instruments collaborated with the customer and a partner to build a hybrid solution based on the NI PXI and PXI Express platforms and the customizable NI Semiconductor Test System (STS). The resulting test system, which they called PISTON, provided unprecedented test performance and flexibility. The results were excellent, including significant test time reductions. The investment in the National Instruments solution was fully paid back within approximately one year of the system being deployed on the production floor.

ON Semiconductor Belgium

Gerd Van den Branden

ON Semiconductor Belgium