Case Study: Texas Instruments streamlines semiconductor characterization with National Instruments TestStand and LabVIEW

NI TestStand Provides the Framework to Texas Instruments $4 Billion Division

The customer, Texas Instruments, Inc., faced a challenge in characterizing their increasingly complex wireless and RF semiconductor devices. The manual and semi-automated processes created a design bottleneck, a problem magnified by their global design teams operating across multiple continents. To address this, they worked with vendor National Instruments to implement a solution using NI TestStand and LabVIEW.

National Instruments provided the framework for an Automated Characterization Environment (ACE) with NI TestStand as its backbone. This solution streamlined test development, management, and automation, enabling global commonality and reuse. The results eliminated the design bottleneck, allowing the $4 billion division to keep pace with new product introductions without sacrificing quality or needing to double its engineering team.

Texas Instruments, Inc.

Marvin Landrum

Texas Instruments, Inc.