Case Study: INTEK S.p.A. achieves automated high-voltage dielectric breakdown testing with National Instruments CompactRIO and LabVIEW

High-Voltage, Time-Dependent Dielectric Breakdown System for the IEC 60747-17 Standard

The customer, INTEK S.p.A., needed to build a fully automatic system to simultaneously test up to 50 magnetic couplers under high voltage (up to 8 kV rms) and high temperature (150 °C), while recording the mean time to failure and monitoring overvoltages. National Instruments provided the solution using their CompactRIO platform with FPGA technology and the LabVIEW development environment.

The solution from National Instruments used a cRIO-9035 controller and NI C Series modules to precisely monitor current, voltage, and temperature. The FPGA-based system was programmed in LabVIEW to detect faults and clear them in under 100 ms, ensuring device integrity. The results successfully satisfied the customer, enabling useful data collection for statistical analysis, improving technology, and reducing test costs.

INTEK S.p.A. Laboratory, Sector Manager

Flavio Floriani

INTEK S.p.A. Laboratory, Sector Manager