Case Study: Project Integration LLC creates an automated test system for high-power IGBT and MOSFET transistors with National Instruments

Automated Test System for High-Power IBGT and MOSFET Transistors

Project Integration LLC faced the challenge of designing an automated test system for the functional and parametric control of static and dynamic parameters in high-power IGBT and MOSFET transistors. They turned to National Instruments to create this complex automated test equipment (ATE).

The solution from National Instruments utilized the LabVIEW software environment and the NI PXI platform to build the test system. This provided an easy-to-use and intuitive interface for the customer and allowed for easy integration with third-party equipment. The resulting system accurately measures a comprehensive list of transistor parameters and enables the customer to easily modify the software and handle all measurement data.

Project Integration LLC

Vardan Aleksanyan

Project Integration LLC