Case Study: Samtec cuts R&D test time from 4 hours to 5 minutes (98% reduction) and halves time‑to‑market with Keysight's 32‑port M9808A PXIe VNA

Samtec Reduces R&D Lab Test Time from Four Hours to Five Minutes

Samtec’s Signal Integrity Group faced the challenge of characterizing high‑speed copper interconnects for hyperscale data centers, where faster data rates and short risetime transitions create signal‑integrity failures. Traditional four‑port VNA testing of a 32‑channel DUT took about four hours (64 measurements), so Samtec turned to Keysight and its N1930B Physical Layer Test System (PLTS) with the 53 GHz M9808A PXIe 32‑port VNA to meet higher‑frequency, multichannel measurement needs.

Using Keysight’s 32‑port VNA and PLTS, Samtec captured all 1,024 S‑parameters in a single measurement and performed complete multidomain analysis (insertion/return loss, TDR impedance, near/far‑end crosstalk). The Keysight solution cut instrument setup and test time from four hours to five minutes (a 98% reduction), shortened design and test cycles, and enabled a 50% faster time‑to‑market for 112 Gbps PAM4 interconnect products.

Samtec