Case Study: Major Research Lab achieves 95% reduction in test time with Keysight PXIe VNA and PathWave Test Automation

Reducing the Complexities Associated with Multiport Component Characterization

Major Research Lab, a research organization working on next‑generation satellite mission programs, faced increasingly complex multiport component characterization for amplifiers, multiplexers and antennas. Their test setups were cumbersome—relying on switch matrices and sequential measurements—which drove long test times and limited throughput. To address this, the lab worked with Keysight, evaluating Keysight PXIe VNAs and the PathWave Test Automation platform.

Keysight delivered a modular PXIe VNA solution with true multiport, parallel measurements and a PathWave Test Automation gain‑compression plug‑in (KS8400A) to automate swept‑frequency and swept‑power measurements. The Keysight solution removed switch complexity, automated gain compression characterization, and produced calibrated results with minimal manual setup, cutting the customer’s test time by about 95% and enabling a scalable, compact next‑generation test configuration.