Case Study: High-Volume Automotive Microcontroller Manufacturer achieves more than 2% reduction in false rejects and over 2% OEE improvement with Keysight PathWave Manufacturing Analytics

Moving From Static Limits to Dynamic Part Average Test (PAT) Limits

High-Volume Automotive Microcontroller Manufacturer faced the need to increase throughput on fully utilized test equipment without degrading device test quality during a global chip shortage. The customer worked with Keysight, deploying PathWave Manufacturing Analytics (PMA) to address excessive false rejects and time-consuming per‑lot static Part Average Test (PAT) limit calculation.

Keysight implemented pseudo real‑time Dynamic PAT limits via PathWave Manufacturing Analytics, updating roughly 1,300 limits every 3 seconds on a handler so limits shift with in‑lot drift while still flagging true defects. The Keysight solution cut total false rejects and unnecessary scrap by greater than 2%, improved Overall Equipment Efficiency by more than 2%, reduced retests and handling, and increased throughput while maintaining test quality.