Case Study: Component and Semiconductor Manufacturing Company achieves rapid, low-risk RF power amplifier testing with Keysight

Minimize Risk When Deploying or Updating RF Power Amplifier Test Systems

Component and Semiconductor Manufacturing Company, a maker of RF power amplifiers and front-end modules, faced growing test bottlenecks as designs added more bands, DPD and envelope-tracking (ET) techniques, and tighter tolerances. They needed a fast, accurate, repeatable test platform but were concerned about the time, expertise and risk required to move to a modular PXI-based system. Keysight’s RF PA/FEM Characterization and Test Reference Solution (PA/FEM Reference Solution) was chosen to address these challenges.

Keysight implemented a complete modular solution—combining Keysight benchtop and PXI hardware (including the M9451A measurement accelerator), N7614B Signal Studio, synchronized AWG, measurement software, supplied test code and application-engineering support—to accelerate evaluation and production integration. The deployment produced measurable gains: rapid first measurements (demo within an hour), power-servo loop times under 3 ms, DPD loop measurements in <70 ms (~20× faster with the M9451A) and about a 40% increase in throughput for a high-volume customer, while reducing setup time and implementation risk.