Case Study: Major Semiconductor Manufacturer achieves automated RTN testing and improved device reliability with Keysight

Major Semiconductor Manufacturer - Customer Case Study

Major Semiconductor Manufacturer faced growing reliability concerns from random telegraph noise (RTN) in MOSFETs that can destabilize SRAM and other devices. They needed a way to measure large volumes of fast current data with a very low noise floor and to automate on‑wafer testing across many devices and bias points. Keysight’s B1500A Semiconductor Device Parameter Analyzer with the WGFMU module and RTN automation software was identified to meet these requirements.

Keysight worked with the Major Semiconductor Manufacturer to deliver a custom, automated RTN test solution built around the B1500A/WGFMU plus drivers for the customer’s test shell, and later released the E4727E3 automated RTN software (integrated with WaferPro Express). The customer purchased multiple B1500A units, adopted Keysight’s solution as their standard, and achieved automated RTN measurement, wafer mapping, system noise‑floor display and large‑scale data collection—significantly improving process characterization and reliability assessment.