Case Study: Indian Institute of Technology Delhi achieves automated, accurate long-duration RF reliability characterization with Keysight

IIT Delhi Professor Automates Reliability Characterization

Indian Institute of Technology Delhi (led by Professor Abhisek Dixit) needed to characterize the reliability of RF CMOS devices operating at mid- to high-frequency bands (including 5G and Wi‑Fi 6) and to run long-duration stress/measure/stress cycles with precise timing. Manual DC and RF measurements were complex, error-prone, and impractical for the extended automated tests required to reproduce field conditions and isolate effects like bias temperature instability.

Keysight delivered an integrated, automated test bench using its B1500 semiconductor device parameter analyzer/characterization system together with a Keysight network analyzer and a probe station, enabling programmable stress, measure and repeat cycles with precise delays. The Keysight-based setup eliminated timing constraints on test duration, reproduced in‑field RF aging to accelerate degradation, produced correlated DC-to-RF reliability data and a degradation model for PDK use, and significantly reduced manual error while supporting 5G and Wi‑Fi 6 characterization.

Indian Institute of Technology Delhi

Abhisek Dixit

Professor