Case Study: Advanced Semiconductor Engineering, Inc. (ASE) achieves 20% faster antenna-in-package (AiP) test time and improved measurement accuracy with Keysight’s PNA (N5227B)

ASE Reduces Antenna-in-Package Test Time by 20% with Keysight’s PNA

Advanced Semiconductor Engineering, Inc. (ASE) is a leader in developing high-frequency antenna-in-packages (AiPs) for 5G and automotive radar but faced significant design and test challenges from increasingly miniature, heterogeneous packages. ASE needed accurate, repeatable measurements that mirror real operating conditions while reducing time-consuming probe station setup, adaptor changes and fixture characterization. To address this, ASE worked with Keysight using the Keysight PNA vector network analyzer 67 GHz (N5227B).

Keysight implemented the PNA-based test solution, providing seamless probe-station integration, automated fixture removal and one-time Cal All calibration, plus true-mode stimulus for mismatch-corrected differential measurements. The Keysight PNA reduced measurement uncertainty and setup effort, raising confidence in S11/S21 correlation, and ASE reported a measurable 20% reduction in overall test time while improving measurement accuracy and repeatability.

Advanced Semiconductor Engineering, Inc. (ASE)

CP Hung

Vice President of Corporate R&D